Test Time Reduction

Opto-electronic assembly line efficiency boost

In this case, avoiding unnecessary shipment & testing costs was possible with deployment of a model for early failure detection.
The goal was to minimize the number of units moving through the costly process and eventually fail at the final steps.
Testing results from all stations were connected to Vanti’s platform and were the basis for training of a pass/fail model.
The model enabled reduction of required tests to assure units’ quality while also provided early discovery of units with a high chance of failing.

info@vanti-analytics.com

+1 (650) 843-9196 (toll free)

©2019 by Vanti.